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Volumn 92, Issue 15, 2008, Pages

Effects of molecular versus atomic oxygen on NiSi and Ni(Pt)Si films grown on both p - and n -doped Si(100)

Author keywords

[No Author keywords available]

Indexed keywords

DOPING (ADDITIVES); FILM GROWTH; KINETICS; NICKEL COMPOUNDS; OXIDATION; PASSIVATION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 42349098893     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2909574     Document Type: Article
Times cited : (6)

References (20)
  • 5
    • 42349112333 scopus 로고    scopus 로고
    • Proceedings of the 11th IPFA Conference, Taiwan, (unpublished).
    • P. F. Hsu, M. H. Tsai, J. Shieh, H. J. Tao, and M. S. Liang, Proceedings of the 11th IPFA Conference, Taiwan, 2004 (unpublished).
    • (2004)
    • Hsu, P.F.1    Tsai, M.H.2    Shieh, J.3    Tao, H.J.4    Liang, M.S.5
  • 14
    • 42349093151 scopus 로고
    • Handbook of X-ray Photoelectron Spectroscopy (Physical Electronics, Eden Prairie, Minnesota).
    • J. F. Moulder, W. F. Stickle, P. E. Sobol, and K. D. Bomben, Handbook of X-ray Photoelectron Spectroscopy (Physical Electronics, Eden Prairie, Minnesota, 1995).
    • (1995)
    • Moulder, J.F.1    Stickle, W.F.2    Sobol, P.E.3    Bomben, K.D.4
  • 15
    • 42349083289 scopus 로고
    • Practical Surface Analysis, 2nd ed. (Wiley, New York).
    • D. Briggs and M. P. Seah, Practical Surface Analysis, 2nd ed. (Wiley, New York, 1990).
    • (1990)
    • Briggs, D.1    Seah, M.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.