-
1
-
-
0035872897
-
-
See, for example, 0021-8979 10.1063/1.1361065, ();, CRC Crit. Rev. Solid State Mater. Sci. 1040-8436 10.1080/714037708 28, 231 (2003);, J. Vac. Sci. Technol. B 0734-211X 10.1116/1.591472 18, 1785 (2000)., J. Appl. Phys. 100, 014111 (2006), and references within these reviews.
-
See, for example, G. D. Wilk, R. M. Wallace, and J. M. Anthony, J. Appl. Phys. 0021-8979 10.1063/1.1361065 89, 5243 (2001); R. M. Wallace and G. D. Wilk, CRC Crit. Rev. Solid State Mater. Sci. 1040-8436 10.1080/714037708 28, 231 (2003); J. Robertson, J. Vac. Sci. Technol. B 0734-211X 10.1116/1.591472 18, 1785 (2000). J. Robertson and B. Falabretti, J. Appl. Phys. 100, 014111 (2006), and references within these reviews.
-
(2001)
J. Appl. Phys.
, vol.89
, pp. 5243
-
-
Wilk, G.D.1
Wallace, R.M.2
Anthony, J.M.3
Wallace, R.M.4
Wilk, G.D.5
Robertson, J.6
Robertson, J.7
Falabretti, B.8
-
2
-
-
11344280629
-
-
M. Kirm, J. Aarik, M. Jürgens, and I. Sildos, Nucl. Instrum. Methods Phys. Res. A 537, 251 (2005).
-
(2005)
Nucl. Instrum. Methods Phys. Res. A
, vol.537
, pp. 251
-
-
Kirm, M.1
Aarik, J.2
Jürgens, M.3
Sildos, I.4
-
4
-
-
4544294836
-
-
J. Aarik, H. Mändar, M. Kirm, and L. Pung, Thin Solid Films 466, 41 (2004).
-
(2004)
Thin Solid Films
, vol.466
, pp. 41
-
-
Aarik, J.1
Mändar, H.2
Kirm, M.3
Pung, L.4
-
5
-
-
79956027162
-
-
Y. J. Cho, N. V. Nguyen, C. A. Richter, J. R. Ehrstein, B. H. Lee, and J. C. Lee, Appl. Phys. Lett. 80, 1249 (2002).
-
(2002)
Appl. Phys. Lett.
, vol.80
, pp. 1249
-
-
Cho, Y.J.1
Nguyen, N.V.2
Richter, C.A.3
Ehrstein, J.R.4
Lee, B.H.5
Lee, J.C.6
-
6
-
-
27644547745
-
-
N. V. Nguyen, A. V. Davydov, D. Chandler-Howowitz, and M. Frank, Appl. Phys. Lett. 87, 192903 (2005).
-
(2005)
Appl. Phys. Lett.
, vol.87
, pp. 192903
-
-
Nguyen, N.V.1
Davydov, A.V.2
Chandler-Howowitz, D.3
Frank, M.4
-
10
-
-
42149133568
-
-
t-Hf O2: Joint Committee on Powder Diffraction Standards Card No. 8-0342.
-
t-Hf O2: Joint Committee on Powder Diffraction Standards Card No. 8-0342.
-
-
-
-
11
-
-
13244267586
-
-
c-Hf O2: Calculated from a=0.508 nm..
-
c-Hf O2: Calculated from a=0.508 nm. J. Kang, E.-C. Lee, and K. J. Chang, Phys. Rev. B 68, 054106 (2003).
-
(2003)
Phys. Rev. B
, vol.68
, pp. 054106
-
-
Kang, J.1
Lee, E.-C.2
Chang, K.J.3
-
12
-
-
42149106752
-
-
o-Hf O2: Calculated from a=0.983 nm, b=0.517 nm, and c=0.496 nm..
-
o-Hf O2: Calculated from a=0.983 nm, b=0.517 nm, and c=0.496 nm. J. E. Jaffe, R. A. Bachorz, and M. Gutowski, Phys. Rev. B 72, 114107 (2005).
-
(2005)
Phys. Rev. B
, vol.72
, pp. 114107
-
-
Jaffe, J.E.1
Bachorz, R.A.2
Gutowski, M.3
-
13
-
-
11444262198
-
-
t- Hfx Aly O2-z: Calculated using x=0.9, y=0.1, and z=0.05, the extreme composition..
-
t- Hfx Aly O2-z: Calculated using x=0.9, y=0.1, and z=0.05, the extreme composition. G. Štefanić, S. Musić, and R. Trojko, J. Alloys Compd. 388, 126 (2005).
-
(2005)
J. Alloys Compd.
, vol.388
, pp. 126
-
-
Štefanić, G.1
Musić, S.2
Trojko, R.3
-
14
-
-
0035494286
-
-
H. Fujimori, M. Yashima, S. Sasaki, M. Kakihana, T. Mori, M. Tanaka, and M. Yoshimura, Phys. Rev. B 64, 134104 (2001).
-
(2001)
Phys. Rev. B
, vol.64
, pp. 134104
-
-
Fujimori, H.1
Yashima, M.2
Sasaki, S.3
Kakihana, M.4
Mori, T.5
Tanaka, M.6
Yoshimura, M.7
-
15
-
-
42149182905
-
-
Joint Committee on Powder Diffraction Standards Card No. 78-0050.
-
Joint Committee on Powder Diffraction Standards Card No. 78-0050.
-
-
-
-
17
-
-
0000165476
-
-
See, for example.
-
See, for example, A. Navrotsky, Am. Mineral. 60, 249 (1975).
-
(1975)
Am. Mineral.
, vol.60
, pp. 249
-
-
Navrotsky, A.1
-
18
-
-
0028485382
-
-
L. Soriano, M. Abbate, D. Alders, and J. M. Sanz, Solid State Commun. 91, 551 (1994).
-
(1994)
Solid State Commun.
, vol.91
, pp. 551
-
-
Soriano, L.1
Abbate, M.2
Alders, D.3
Sanz, J.M.4
-
20
-
-
1642588409
-
-
W. L. Scopel, A. J. R. da Silva, W. Orellana, and A. Fazzio, Appl. Phys. Lett. 84, 1492 (2004).
-
(2004)
Appl. Phys. Lett.
, vol.84
, pp. 1492
-
-
Scopel, W.L.1
Da Silva, A.J.R.2
Orellana, W.3
Fazzio, A.4
-
21
-
-
42149169004
-
-
Amorphous and Liquid Semiconductors (Plenum, London), Cha.
-
J. Tauc, Amorphous and Liquid Semiconductors (Plenum, London, 1974), Chap..
-
(1974)
-
-
Tauc, J.1
-
22
-
-
0021558454
-
-
in Hydrogenated Amorphous Silicon: Optical Properties, edited by J. Pankove, Semiconductors and Semimetals Series, Vol. (Academic, New York), (Cody uses the term "nondirect" to signify an interband transition in which momentum is not conserved either because the transition is indirect, or if spatial or thermal disorder precludes momentum conservation.)
-
G. D. Cody, in Hydrogenated Amorphous Silicon: Optical Properties, edited by, J. Pankove, Semiconductors and Semimetals Series, Vol. 21 (Academic, New York, 1984), pp. 11-82. (Cody uses the term "nondirect" to signify an interband transition in which momentum is not conserved either because the transition is indirect, or if spatial or thermal disorder precludes momentum conservation.)
-
(1984)
, vol.21
, pp. 11-82
-
-
Cody, G.D.1
|