A new Si/CdTe semiconductor Compton camera developed for high-angular resolution

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6706, Issue , 2007, Pages

  Takeda, Shin'ichiro ^a,b   Ishikawa, Shin Nosuke ^a,b   Odaka, Hirokazu ^a,b   Watanabe, Shin ^a,b   Takahashi, Tadayuki ^a,b   Nakazawa, Kazuhiro ^b   Tajima, Hiroyasu ^c   Kuroda, Yoshikatsu ^d   Onishi, Mitsunobu ^d   Rikazawa, Yasushi ^e   Yasuda, Hajimu ^e  

^a JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

^c SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^d MITSUBISHI HEAVY INDUSTRIES LTD   (Japan)

^e HIROSHIMA UNIVERSITY   (Japan)

Author keywords

CdTe pixel detector; Compton camera; Gamma ray astronomy; Silicon strip detector

Indexed keywords

CAMERAS; COMPTON SCATTERING; GAMMA RAYS; IMAGE RESOLUTION; PIXELS;

CDTE PIXEL DETECTORS; COMPTON CAMERAS; GAMMA-RAY ASTRONOMY; SILICON STRIP DETECTORS;

SEMICONDUCTOR DETECTORS;

EID: 42149174902     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.733840     Document Type: Conference Paper

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