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Volumn 51, Issue 5 I, 2004, Pages 2432-2436

A prototype Si/CdTe compton camera and the polarization measurement

Author keywords

CdTe; Compton camera; Polarimeter; Semiconductor detectors

Indexed keywords

COMPUTER SIMULATION; ELECTROMAGNETIC WAVE POLARIZATION; GAMMA RAYS; MONTE CARLO METHODS; POLARIMETERS; RADIATION DETECTORS; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICES;

EID: 8344280452     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2004.835653     Document Type: Article
Times cited : (40)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.