A Si/CdTe semiconductor Compton camera

IEEE Transactions on Nuclear Science

Volumn 52, Issue 5 III, 2005, Pages 2045-2051

  Watanabe, Shin ^a   Tanaka, Takaaki ^a,b   Nakazawa, Kazuhiro ^a   Mitani, Takefumi ^a,b   Oonuki, Kousuke ^a,b   Takahashi, Tadayuki ^a,b   Takashima, Takeshi ^a   Tajima, Hiroyasu ^c   Fukazawa, Yasushi ^d   Nomachi, Masaharu ^e   Kubo, Shin ^f   Onishi, Mitsunobu ^g   Kuroda, Yoshikatsu ^g  

^a JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

^c SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^d HIROSHIMA UNIVERSITY   (Japan)

^e OSAKA UNIVERSITY   (Japan)

^f Clear Pulse Ltd   (Japan)

^g MITSUBISHI HEAVY INDUSTRIES LTD   (Japan)

Author keywords

CdTe; Compton camera; Gamma ray astronomy detectors; Gamma ray spectroscopy detectors; Silicon radiation detectors

Indexed keywords

GAMMA RAYS; IMAGE RECONSTRUCTION; RADIATION DETECTORS; SEMICONDUCTING CADMIUM TELLURIDE; SILICON;

CDTE; COMPTON CAMERA; GAMMA-RAY ASTRONOMY DETECTORS; GAMMA-RAY SPECTROSCOPY DETECTORS; SILICON RADIATION DETECTORS;

IMAGING SYSTEMS;

EID: 29144439813     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2005.856995     Document Type: Article

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