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Volumn 92, Issue 14, 2008, Pages

Structural and optical properties of ZnO thin films by rf magnetron sputtering with rapid thermal annealing

Author keywords

[No Author keywords available]

Indexed keywords

MAGNETRON SPUTTERING; OPTICAL PROPERTIES; STRUCTURAL PROPERTIES; ZINC OXIDE;

EID: 42149162919     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2896642     Document Type: Article
Times cited : (43)

References (12)
  • 10
    • 42149115050 scopus 로고
    • Materials Analysis by Ion Channeling: Submicron Crystallography (Academic, New York).
    • L. C. Feldman, J. W. Mayer, and S. T. Picraux, Materials Analysis by Ion Channeling: Submicron Crystallography (Academic, New York, 1982).
    • (1982)
    • Feldman, L.C.1    Mayer, J.W.2    Picraux, S.T.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.