Characterization of beryllium and CVD diamond for synchrotron radiation beamline windows and x-ray beam monitor

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6705, Issue , 2007, Pages

  Goto, S ^a   Takahashi, S ^a   Kudo, T ^a   Yabashi, M ^b   Tamasaku, K ^b   Nishino, Y ^b   Ishikawa, T ^b  

^a SPring 8/JASRI ^*  (Japan)

^b RIKEN   (Japan)

Author keywords

Beryllium window; Coherent x rays; CVD diamond; PVD beryllium; Synchrotron radiation

Indexed keywords

CHARACTERIZATION; CHEMICAL VAPOR DEPOSITION; DIAMOND FILMS; DIAMONDS; OPTICAL RESOLVING POWER; PHYSICAL VAPOR DEPOSITION; POLYCRYSTALLINE MATERIALS; SYNCHROTRON RADIATION;

BERYLLIUM WINDOW; COHERENT X-RAYS;

BERYLLIUM;

EID: 42149120335     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.735356     Document Type: Conference Paper

References (16)

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