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Volumn 879, Issue , 2007, Pages 1380-1386

Evaluation of defects inside beryllium foils using X-ray computed tomography and shearing interferometry

Author keywords

Beryllium; Shearing interferometry; X ray computed tomography

Indexed keywords


EID: 33947392454     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2436322     Document Type: Conference Paper
Times cited : (7)

References (3)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.