|
Volumn 879, Issue , 2007, Pages 1380-1386
|
Evaluation of defects inside beryllium foils using X-ray computed tomography and shearing interferometry
a b c c c b,c |
Author keywords
Beryllium; Shearing interferometry; X ray computed tomography
|
Indexed keywords
|
EID: 33947392454
PISSN: 0094243X
EISSN: 15517616
Source Type: Conference Proceeding
DOI: 10.1063/1.2436322 Document Type: Conference Paper |
Times cited : (7)
|
References (3)
|