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Volumn 77, Issue 12, 2006, Pages

Synchrotron radiation x-ray beam profile monitor using chemical vapor deposition diamond film

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; PHOTOLUMINESCENCE; POLYCRYSTALLINE MATERIALS; SILICON; SYNCHROTRON RADIATION;

EID: 33846093432     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2403843     Document Type: Article
Times cited : (17)

References (13)
  • 11
    • 33846084929 scopus 로고    scopus 로고
    • http://physics.nist.gov/PhysRefData/contents.html.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.