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Volumn 5, Issue 3, 1998, Pages 596-599
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Characterization of windows and filters for coherent X-ray beamlines
a
HITACHI LTD
(Japan)
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Author keywords
Beryllium window; Coherence; Phase contrast; Small angle scattering; X ray beamlines
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Indexed keywords
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EID: 0032396950
PISSN: 09090495
EISSN: None
Source Type: Journal
DOI: 10.1107/S0909049597020165 Document Type: Article |
Times cited : (13)
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References (12)
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