Effect of surface roughness on the spatial coherence of X-ray beams from third-generation synchrotron radiation sources

Journal of Synchrotron Radiation

Volumn 7, Issue 4, 2000, Pages 209-214

  Wang, Yun ^a   Xiao, Tiqiao ^a   Xu, Hongjie ^a  

^a INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

Coherence; In line holography; Roughness

Indexed keywords

EID: 0034396482     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049500004234     Document Type: Article

References (3)

1. Goodman, J. W. (1968). Introduction to Fourier Optics. London: McGraw-Hill.
2. Snigirev, A. (1996). Proc. SPIE, 2856, 26-33.
3. Snigirev, A., Snigireva, I., Kohn, V. G. & Kuznetsov, S. M. (1996). Nucl. Instrum. Methods, A370, 634-640.