An investigation of electrical current induced phase transformations in the NiPtSi/polysilicon system

Journal of Applied Physics

Volumn 103, Issue 7, 2008, Pages

  Kim, Deok Kee ^a   Domenicucci, Anthony ^a   Iyer, Subramanian S ^a  

^a IBM RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; DOPING (ADDITIVES); ELECTROMIGRATION; MELTING; MICROSTRUCTURE; PHASE TRANSITIONS; POLYSILICON;

OVERPROGRAMMED FUSE; POSTPROGRAMMING RESISTANCE;

NICKEL ALLOYS;

EID: 42149108500     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2899959     Document Type: Article

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