Analyzing crack-tip dislocations and their shielding effect on fracture toughness

Materials Science and Engineering: A

Volumn 483-484, Issue 1-2 C, 2008, Pages 13-18

  Higashida, K ^a   Tanaka, M ^a   Hartmaier, A ^b   Hoshino, Y ^a  

^a KYUSHU UNIVERSITY   (Japan)

^b UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

Brittle ductile transition; High voltage electron microscopy; Silicon

Indexed keywords

CRACK TIPS; CRYSTALS; DISLOCATIONS (CRYSTALS); FRACTURE TOUGHNESS; PHOTOELASTICITY; STRESS CONCENTRATION; STRESS INTENSITY FACTORS; TENSILE STRESS;

CRACK-DISLOCATION INTERACTION; SILICON CRYSTALS;

SILICON;

CRACK TIPS; CRYSTALS; DISLOCATIONS (CRYSTALS); FRACTURE TOUGHNESS; PHOTOELASTICITY; SILICON; STRESS CONCENTRATION; STRESS INTENSITY FACTORS; TENSILE STRESS;

EID: 41849091164     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2006.12.174     Document Type: Article

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