TEM/AFM observation of crack tip plasticity in silicon single crystals

Materials Transactions

Volumn 42, Issue 9, 2001, Pages 1839-1842

  Tanaka, M ^a   Fukui, T ^a   Yamagata, T ^a   Morikawa, T ^a   Higashida, K ^a   Onodera, R ^a  

^a KYUSHU UNIVERSITY   (Japan)

Author keywords

Atomic force microscopy; Brittle to ductile transition; Crack; Dislocation; Fracture; High voltage electron microscopy; Silicon crystal; Toughness; Transmission electron microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; BRITTLENESS; CRACK INITIATION; HEAT TREATMENT; HIGH RESOLUTION ELECTRON MICROSCOPY; PLASTICITY; RESIDUAL STRESSES; SILICON WAFERS; TOUGHNESS; TRANSMISSION ELECTRON MICROSCOPY;

CRACK TIP PLASTICITY;

SINGLE CRYSTALS;

EID: 0035159674     PISSN: 13459678     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans.42.1839     Document Type: Conference Paper

References (12)