Interaction of light with Si nanowire films

Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4

Volumn 1, Issue , 2006, Pages 111-113

  Tsakalakos, Loucas ^a   Balch, Joleyn ^a   Fronheiser, Jody ^a   Shih, Min Yi ^a   LeBoeuf, Stephen F ^a   Pietrzykowski, Matthew ^a   Codella, Peter J ^a   Sulima, Oleg ^b   Rand, Jim ^b   Kumar, Anil D ^c   Korevaar, Bas A ^a  

^a GENERAL ELECTRIC COMPANY   (United States)

^b GE ENERGY   (United States)

^c GE GLOBAL RESEARCH   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY GAP; NANOCRYSTALLINE SILICON; OPTICAL PROPERTIES; REFLECTION; RESONANCE; THIN FILMS; WAVELENGTH; WET ETCHING;

NANOWIRE ARRAYS; NANOWIRE THIN FILMS; TOTAL REFLECTANCE;

NANOWIRES;

EID: 41749122623     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/WCPEC.2006.279376     Document Type: Conference Paper

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