Morphology and electrical transport in pentacene films on silylated oxide surfaces

Journal of Materials Research

Volumn 19, Issue 7, 2004, Pages 2003-2007

  Shankar, Karthik ^a   Jackson, Thomas N ^a  

^a The Pennsylvania State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; ELECTRIC PROPERTIES; FILM GROWTH; MONOLAYERS; MORPHOLOGY; SELF ASSEMBLY; SILANES; SILICON COMPOUNDS; SUBLIMATION; THIN FILMS; TRANSPORT PROPERTIES;

ELECTRIC TRANSPORT PROPERTIES; OCTADECYLTRICHLOROSILANE; PENTACENE; PENTACENE THIN FILMS; PHENYLTRICHLOROSILANE; SELF ASSEMBLED MONOLAYERS; SILYLATED OXIDE SURFACES;

SEMICONDUCTING ORGANIC COMPOUNDS;

EID: 4143056974     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2004.0255     Document Type: Article

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