Statistical characterization of thermally evaporated rough CaF2 films

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 70, Issue 5 1, 2004, Pages

  Luhman, D R ^a   Hallock, R B ^a  

^a UNIVERSITY OF MASSACHUSETTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALCIUM COMPOUNDS; DATA REDUCTION; IMAGE ANALYSIS; LOW TEMPERATURE EFFECTS; POROSITY; PROFILOMETRY; QUARTZ; SURFACE ROUGHNESS; SURFACE TREATMENT; THICKNESS MEASUREMENT; VACUUM;

DYNAMICAL SCALING; MULTIFRACTALITY; REPLICATION TECHNIQUES; SURFACE PLASMON TECHNIQUES;

METALLIC FILMS;

EID: 41349094768     PISSN: 15393755     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.70.051606     Document Type: Article

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