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Volumn 15, Issue 12, 2003, Pages 1889-1898
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Height fluctuations and intermittency of V2O5 films by atomic force microscopy
a b a,c,d e |
Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
COMPUTER SIMULATION;
FRACTALS;
SURFACE ROUGHNESS;
HEIGHT-DIFFERENCE FLUCTUATION;
INTERMITTENCY;
SPATIAL SCALING LAW;
VANADIUM PENTOXIDE;
VANADIUM COMPOUNDS;
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EID: 0345382816
PISSN: 09538984
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-8984/15/12/306 Document Type: Article |
Times cited : (20)
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References (26)
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