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Volumn 15, Issue 12, 2003, Pages 1889-1898

Height fluctuations and intermittency of V2O5 films by atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; FRACTALS; SURFACE ROUGHNESS;

EID: 0345382816     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/15/12/306     Document Type: Article
Times cited : (20)

References (26)
  • 15
    • 0345266943 scopus 로고
    • Bunde A and Havlin S (ed); (Berlin: Springer)
    • Bunde A and Havlin S (ed) 1991 Fractal and Disordered Systems (Berlin: Springer) p 15
    • (1991) Fractal and Disordered Systems , pp. 15


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.