Fractal analysis of sampled profiles: Systematic study

Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics

Volumn 65, Issue 2, 2002, Pages

  Castelnovo, C ^a   Podesta A ^a   Piseri, P ^a   Milani, P ^a  

^a UNIVERSITY OF MILAN   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMIC LANGUAGES; ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; INTERFACES (MATERIALS); SAMPLING; STATISTICAL METHODS; SURFACE TOPOGRAPHY; VAPOR DEPOSITION;

HURST EXPONENT; ION SPUTTERING; SCANNING PROBE MICROSCOPY; SELF-AFFINE STRUCTURES;

FRACTALS;

EID: 37649026550     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.65.021601     Document Type: Article

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