Evidence for power-law dominated noise in vacuum deposited CaF2

Physical Review Letters

Volumn 92, Issue 25 I, 2004, Pages

  Luhman, D R ^a   Hallock, R B ^a  

^a UNIVERSITY OF MASSACHUSETTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FLOW OF FLUIDS; GAUSSIAN NOISE (ELECTRONIC); KINETIC THEORY; MATHEMATICAL MODELS; NONLINEAR EQUATIONS; POROUS MATERIALS; PROBABILITY DISTRIBUTIONS; RANDOM PROCESSES; SURFACE ROUGHNESS; SURFACE TENSION; THIN FILMS; VACUUM DEPOSITED COATINGS;

GLASS SUBSTRATES; GLASS SURFACE; KINETIC ROUGHNESS; POWER-LAW DISTRIBUTION;

CALCIUM COMPOUNDS;

EID: 3442892939     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.92.256102     Document Type: Article

References (24)

1. A.-L. Barabási and H.E. Stanley, Fractal Concepts in Surface Growth (Cambridge Unversity Press, New York, 1995).
2. T. Halpin-Healy and Y-C. Zhang, Phys. Rep. 254, 215 (1995).
3. M. Marsili, A. Maritan, F. Toigo, and J. R. Banavar, Rev. Mod Phys. 68, 963 (1996).
4. Y-C. Zhang, J. Phys. (Paris) 51, 2129 (1990).
5. Y-C. Zhang, Physica (Amsterdam) 170A, 1 (1990).
6. V. K. Horáth, F. Family, and T. Vicseck, Phys. Rev. Lett. 67, 3207 (1991).
7. V. K. Horáth, F. Family, and T. Vicseck, J. Phys. A 24, L25 (1991).
8. M. Myllys, J. Maunuksela, M. Alava, T. Ala-Nissila, and J. Timonen, Phys. Rev. Lett. 84, 1946 (2001); M. Myllys, J. Maunuksela, M. Alava, T. Ala-Nissila, J. Merikoski, and J. Timonen, Phys. Rev. E 64, 036101 (2001).
9. M. Myllys, J. Maunuksela, M. Alava, T. Ala-Nissila, and J. Timonen, Phys. Rev. Lett. 84, 1946 (2001); M. Myllys, J. Maunuksela, M. Alava, T. Ala-Nissila, J. Merikoski, and J. Timonen, Phys. Rev. E 64, 036101 (2001).
10. F. Family and T. Vicsek, J. Phys. A 18, L75 (1985).
11. M. Kardar, G. Parisi, and Y-C. Zhang, Phys. Rev. Lett. 56, 889 (1986).
12. P. Meakin, P. Ramanlal, L. M. Sander, and R.C. Ball, Phys. Rev. A 34, 5091 (1986).
13. J. Krug, Phys. Rev. A 36, 5465 (1987).
14. E. Medina, T. Hwa, M. Kardar, and Y.-C Zhang, Phys. Rev. A 39, 3053 (1989).
15. J. Krug, J. Phys. I (France) 1, 9 (1990).
16. C.-H. Lam and L. M. Sander, Phys. Rev. Lett. 69, 3338 (1992); C.-H. Lam and L. M. Sander, Phys. Rev. E 48, 979 (1993).
17. C.-H. Lam and L. M. Sander, Phys. Rev. Lett. 69, 3338 (1992); C.-H. Lam and L. M. Sander, Phys. Rev. E 48, 979 (1993).
18. R. Bourbonnais, J. Kertèsz, and D.E. Wolf, J. Phys. II (France) 1, 493 (1991).
19. D. R. Luhman and R. B. Hailock (to be published).
20. D. R. Luhman and R. B. Hallock (to be published).
21. A.-L. Barabási, R. Bourbonnais, M. Jensen, J. Kertèsz, T. Viscsek, and Y.-C Zhang, Phys. Rev. A 45, 6951 (1992).
22. C.-H. Lam and L. M. Sander, J. Phys. A 25, L135 (1992).
23. Z. Csahók, K. Honda, E. Somfai, M. Viscek, and T. Vicsek, Physica (Amsterdam) 200A, 136 (1993).
24. C. Tang, S. Alexander, and R. Bruinsma, Phys. Rev. Lett. 64, 772 (1990).