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Volumn 82, Issue 8, 2008, Pages 794-798

Structural and electrical properties of Au and Ti/Au contacts to n-type GaN

Author keywords

Electrical properties; Electron microscopy; GaN; Solid phase reaction; Thin films

Indexed keywords

DEPOSITION; ELECTRIC PROPERTIES; ELECTRON MICROSCOPY; GALLIUM NITRIDE; THIN FILMS; TITANIUM;

EID: 41249092071     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2007.11.005     Document Type: Article
Times cited : (22)

References (19)
  • 18
    • 41249100752 scopus 로고    scopus 로고
    • [preprint, and references therein]
    • Osvald J. Appl Surf Sci 1 (2008) [preprint, and references therein]
    • (2008) Appl Surf Sci , vol.1
    • Osvald, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.