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Volumn 82, Issue 8, 2008, Pages 794-798
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Structural and electrical properties of Au and Ti/Au contacts to n-type GaN
c
CRHEA CNRS
(France)
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Author keywords
Electrical properties; Electron microscopy; GaN; Solid phase reaction; Thin films
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Indexed keywords
DEPOSITION;
ELECTRIC PROPERTIES;
ELECTRON MICROSCOPY;
GALLIUM NITRIDE;
THIN FILMS;
TITANIUM;
GOLD DIFFUSION;
SOLID PHASE REACTION;
GOLD;
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EID: 41249092071
PISSN: 0042207X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.vacuum.2007.11.005 Document Type: Article |
Times cited : (22)
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References (19)
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