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Volumn 966, Issue , 2006, Pages 134-139

Molecular beam epitaxial growth and dielectric characterization of Ba 0.6Sr0.4TiO3 films

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; DIELECTRIC PROPERTIES; EPITAXIAL GROWTH; FILM GROWTH; HIGH ENERGY ELECTRON DIFFRACTION; MOLECULAR BEAM EPITAXY; THIN FILMS;

EID: 41049092324     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-0966-t07-23     Document Type: Conference Paper
Times cited : (1)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.