Disappearance of stress singularity at interface edge due to nanostructured thin film

Engineering Fracture Mechanics

Volumn 75, Issue 10, 2008, Pages 3073-3083

  Sumigawa, Takashi ^a   Hirakata, Hiroyuki ^b   Takemura, Masaki ^a   Matsumoto, Shohei ^a   Suzuki, Motofumi ^a   Kitamura, Takayuki ^a  

^a KYOTO UNIVERSITY   (Japan)

^b OSAKA UNIVERSITY   (Japan)

Author keywords

Crack tip; Dynamic oblique deposition; Free edge; Interface; Nanosprings; Singularity; Stress concentration; Stress reduction; Thin film

Indexed keywords

ANISOTROPY; CRACK TIPS; ELASTIC MODULI; FINITE ELEMENT METHOD; INTERFACES (MATERIALS); NANOSTRUCTURED MATERIALS; SHEAR DEFORMATION;

DYNAMIC OBLIQUE DEPOSITION; NANOSPRING; STRESS SINGULARITY;

STRESS CONCENTRATION;

ANISOTROPY; CRACK TIPS; ELASTIC MODULI; FINITE ELEMENT METHOD; INTERFACES (MATERIALS); NANOSTRUCTURED MATERIALS; SHEAR DEFORMATION; STRESS CONCENTRATION;

EID: 40849130898     PISSN: 00137944     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.engfracmech.2007.12.010     Document Type: Article

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