A study in the computation time required for the inclusion of strain field effects in Bloch-wave simulations of TEM diffraction contrast images

Ultramicroscopy

Volumn 108, Issue 5, 2008, Pages 415-425

  Dulong, B J ^a   Haynes, R D ^a   Robertson, M D ^a  

^a ACADIA UNIVERSITY   (Canada)

Author keywords

Computer modeling and simulation; Diffraction contrast; Numerical integration; Strain field; Transmission electron microscopy

Indexed keywords

COMPUTER SIMULATION; CRYSTALLOGRAPHY; DIFFRACTION; TRANSMISSION ELECTRON MICROSCOPY;

BLOCH-WAVE SIMULATIONS; STRAIN FIELD EFFECTS;

IMAGING TECHNIQUES;

QUANTUM DOT;

ARTICLE; COMPUTER MODEL; COMPUTER PROGRAM; DIFFRACTION; IMAGING; MATHEMATICAL ANALYSIS; MATHEMATICAL COMPUTING; SIMULATION; TECHNIQUE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 40749129185     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.05.010     Document Type: Article

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