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Volumn 29, Issue 1, 2000, Pages 59-72

Integrated machine learning approaches for complementing statistical process control procedures

Author keywords

[No Author keywords available]

Indexed keywords

DATA HANDLING; LEARNING ALGORITHMS; NEURAL NETWORKS; PATTERN RECOGNITION; PROBLEM SOLVING; QUALITY CONTROL; STATISTICAL PROCESS CONTROL;

EID: 0033745771     PISSN: 01679236     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-9236(00)00063-4     Document Type: Article
Times cited : (22)

References (24)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.