Scanning magnetoresistance microscopy of atom chips

Review of Scientific Instruments

Volumn 79, Issue 2, 2008, Pages

  Volk, M ^a,b   Whitlock, S ^a,c   Wolff, C H ^a   Hall, B V ^a   Sidorov, A I ^a  

^a SWINBURNE UNIVERSITY OF TECHNOLOGY   (Australia)

^b Solar Systems Pty Ltd   (Australia)

^c UNIVERSITY OF AMSTERDAM   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC WIRE; GEOMETRY; MAGNETIC FIELDS; MAGNETIC FILMS; MAGNETORESISTANCE; NUMERICAL ANALYSIS;

ATOM CHIPS; BOSE-EINSTEIN CONDENSATES; GEOMETRIC MODULATIONS; SCANNING MAGNETORESISTIVE (MR) MICROSCOPES;

ATOMS;

EID: 40349111119     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2839015     Document Type: Article

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