Position noise in scanning superconducting quantum interference device microscopy

Applied Physics Letters

Volumn 84, Issue 24, 2004, Pages 5001-5003

  Lee, Su Young ^a   Matthews, J ^a   Wellstood, F C ^a  

^a Bldg 142   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MAGNETIC NOISE; SCANNING SEPARATIONS; SIGNAL STRENGTH; SOURCE-SAMPLE SEPARATION;

ACOUSTIC NOISE; CURRENT DENSITY; IMAGE ANALYSIS; IMAGE QUALITY; MAGNETIC FIELD EFFECTS; OPTICAL RESOLVING POWER; SCANNING; SENSITIVITY ANALYSIS;

SQUIDS;

EID: 3042748459     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1763215     Document Type: Article

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