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Volumn 20, Issue 1, 2008, Pages 8-12

Effect of interconnection area on shear strength of sintered joint with nano-silver paste

Author keywords

Shear strength; Sintering

Indexed keywords

ELECTRONICS PACKAGING; MICROELECTRONICS; NANOSTRUCTURED MATERIALS; SHEAR STRENGTH; SINTERING; SOLDERED JOINTS;

EID: 40249119794     PISSN: 09540911     EISSN: None     Source Type: Journal    
DOI: 10.1108/09540910810861431     Document Type: Article
Times cited : (39)

References (8)
  • 1
    • 33748585230 scopus 로고    scopus 로고
    • Low temperature sintered nanoscale silver as a novel semiconductor device-metallized substrate interconnect material
    • Bai, G.J., Zhang, Z.Z. and Lu, G-Q. (2006), "Low temperature sintered nanoscale silver as a novel semiconductor device-metallized substrate interconnect material", IEEE Trans. Compon. Packg. Technol., Vol. 29 No. 3, pp. 589-93.
    • (2006) IEEE Trans. Compon. Packg. Technol. , vol.29 , Issue.3 , pp. 589-93
    • Bai, G.J.1    Zhang, Z.Z.2    Lu, G.-Q.3
  • 2
    • 14644392839 scopus 로고    scopus 로고
    • The changing automotive environment: High-temperature electronics
    • Johnson, R.W. and Evans, J.L. (2004), "The changing automotive environment: high-temperature electronics", IEEE Trans. Electronics Packaging Manufacturing, Vol. 27 No. 3, pp. 164-76.
    • (2004) IEEE Trans. Electronics Packaging Manufacturing , vol.27 , Issue.3 , pp. 164-76
    • Johnson, R.W.1    Evans, J.L.2
  • 4
  • 5
    • 0028734811 scopus 로고
    • High-power InGaN/AlGaN double-heterostructure blue-light-emitting diodes
    • Nakamura, S. (1994), "High-power InGaN/AlGaN double-heterostructure blue-light-emitting diodes", paper presented at Electron Devices Meeting, pp. 567-70.
    • (1994) Electron Devices Meeting , pp. 567-70
    • Nakamura, S.1
  • 7
    • 34848862467 scopus 로고    scopus 로고
    • Low-temperature sintering with nano silver paste in die-attached interconnection
    • Wang, T., Chen, X., Lu, G-Q. and Lei, G-Y. (2007), "Low-temperature sintering with nano silver paste in die-attached interconnection", Journal of Electronic Materials, Vol. 36 No. 10, pp. 1333-40.
    • (2007) Journal of Electronic Materials , vol.36 , Issue.10 , pp. 1333-40
    • Wang, T.1    Chen, X.2    Lu, G.-Q.3    Lei, G.-Y.4
  • 8
    • 33750841291 scopus 로고    scopus 로고
    • Thermomechanical reliability of low-temperature sintered silver die attached sic power device assembly
    • Bai, J.G. and Lu, G-Q. (2006), "Thermomechanical reliability of low-temperature sintered silver die attached sic power device assembly", IEEE Trans. Device Materials Reliability, Vol. 6 No. 3, pp. 436-41.
    • (2006) IEEE Trans. Device Materials Reliability , vol.6 , Issue.3 , pp. 436-41
    • Bai, J.G.1    Lu, G.-Q.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.