Emission statistics of X-ray induced photoelectrons and its comparison with electron- and ion-induced electron emissions

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 266, Issue 4, 2008, Pages 541-548

  Ohya, K ^a   Inai, K ^a   Nisawa, A ^b   Itoh, A ^c  

^a UNIVERSITY OF TOKUSHIMA   (Japan)

^b RIKEN HARIMA INSTITUTE   (Japan)

^c KYOTO UNIVERSITY   (Japan)

Author keywords

Emission statistics; Ion induced electron emission; Monte Carlo simulation; Photoelectron emission; Secondary electron emission; X ray

Indexed keywords

COMPUTER SIMULATION; MONOCHROMATORS; STATISTICAL MECHANICS; X RAY PHOTOELECTRON SPECTROSCOPY; X RAYS;

EMISSION STATISTICS; ION-INDUCED ELECTRON EMISSION; PHOTOELECTRON EMISSIONS; SECONDARY ELECTRON EMISSION;

SECONDARY EMISSION;

EID: 40249113016     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2007.12.058     Document Type: Article

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