Monte-Carlo simulation of secondary electron emission by x-ray irradiation - An application of x-ray absorption near-edge structure (XANES)

Surface and Interface Analysis

Volumn 36, Issue 10, 2004, Pages 1413-1416

  Iyasu, Takeshi ^a   Tamura, Keiji ^a   Shimizu, Ryuichi ^a   Zhang, Zengming ^b   Koshikawa, Takanori ^b   Yoshikawa, Hideki ^c   Fukushima, Sei ^c  

^a OSAKA INSTITUTE OF TECHNOLOGY   (Japan)

^b OSAKA ELECTRO COMMUNICATION UNIVERSITY   (Japan)

^c NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Auger electron; Monte Carlo simulation; PEEM; Photoelectron; Secondary electron

Indexed keywords

COMPUTER SIMULATION; MONTE CARLO METHODS; PHOTOEMISSION; PHOTOIONIZATION; PHOTONS; POLYCRYSTALLINE MATERIALS; SILVER; SYNCHROTRON RADIATION; X RAY ANALYSIS;

AUGER ELECTRON; PHOTOELECTRONS; PHOTOEMISSION ELECTRON MICROSCOPY (PEEM); SECONDARY ELECTRON;

ELECTRON EMISSION;

EID: 6344254515     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1932     Document Type: Article

References (7)

1. Zhang Z-M, Koshikawa T, Iyasu T, Shimizu R, Goto K. Surf. Interface Anal. 2003; 35: 403.
2. Shimizu R, Iyasu T. J. Surf. Anal 2002; 9: 213.
3. Wells OC. Scanning Electron Microscopy. McGraw-Hill: New York, 1974.
4. Krause MO. In Proceedings of the International Conference on Inner-Shell Ionization Phenomena and future Applications, Fink RW, Manson ST, Palms JM, Rao PV (eds), Conf. 720404, vol.3.1973; 1586.
5. Zhang Z, Koshikawa T, Tamura K, Iyasu T, Shimizu R, Yoshikawa H, Fukushima S, Tanaka A. Surf. Interface Anal. 2004; 36: 334.
6. Seiler H. J. Appl. Phys. 1983; 54(11): R1.
7. ICRU Report 31. ICRU: 1979.