Beyond the conventional MOSFET

European Solid-State Device Research Conference

Volumn , Issue , 2001, Pages 69-72

  Wong, H S Philip ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MOS-FET;

EID: 40249088420     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSDERC.2001.195206     Document Type: Conference Paper

References (26)

1. International Technology Roadmap for Semiconductors, SIA, 1999.
2. G. Moore, IEDM, p. 11, 1975.
3. R. Dennard, J. Solid State Circuits, p. 256, 1974.
4. P. Packan, Science, vol. 285, p. 2079, 1999.
5. H.-S. P. Wong, D. Frank, P. Solomon, C. Wann, J. Welser, Proc. IEEE, p. 537, 1999.
6. C. Fiegna et al., Symp. VLSI Tech., p. 33, 1992.
7. D. Frank, S. Laux, M. Fischetti, IEDM, p. 553, 1992.
8. H.-S. P. Wong, D. Frank, P. Solomon, p. 407, IEDM, 1998.
9. D. Frank, R. Dennard, E. Nowak, P. Solomon, Y. Taur, H.-S. P. Wong, IEEE Proc., p. 259, 2001.
10. H.-S. P. Wong, K. Chan, Y. Taur, IEDM, p. 427, 1997.
11. J.-H. Lee et al., IEDM, p. 71, 1999.
12. X. Huang et al., IEDM, p. 67, 1999.
13. H.-S. Wong, D. Frank, Y. Taur, J. Stork, IEDM, p. 747, 1994.
14. E. Jones et al., Device Research Conf. June 2001.
15. S. Tiwari et al., IEDM, p. 939-941, 1997.
16. K. Rim, J. Hoyt, J. Gibbons, IEDM, p. 707-710, 1998.
17. K. Rim et al., Symp. VLSI Technology, p. 59, June 2001.
18. L. Huang et al., Symp. VLSI Technology, p. 57, June 2001.
19. T. Mizuno et al., Symp. VLSI Technology, p. 210, 2000.
20. E. Gusev et al., in F. Rooseboom et al. eds., ECS, 2001.
21. D. Buchanan et al., IEDM, p. 223-226, 2000.
22. A. Chatterjee et al., IEDM, p. 821-824, 1997.
23. Y. Taur, C. Wann, D. Frank, IEDM, p. 553, 1998.
24. R. Chau et al., IEDM, p. 45, 2000.
25. R. Chau, IEEE Silicon Nanoelectronics Workshop, p. 2-3, Kyoto, Japan, June 2001.
26. K. Guarini, P. Solomon, et al., to be published.