Compact electron beam ion sources/traps: Review and prospects (invited)

Review of Scientific Instruments

Volumn 79, Issue 2, 2008, Pages

  Zschornack, G ^a   Kreller, M ^a   Ovsyannikov, V P ^b   Grossman, F ^b   Kentsch, U ^b   Schmidt, M ^b   Ullmann, F ^b   Heller, R ^c  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b DREEBIT GmbH   (Germany)

^c INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; ELECTRON TRAPS; FOCUSED ION BEAMS; X RAY SPECTROSCOPY;

CHARGE STATES; ION CURRENTS;

ION SOURCES;

EID: 40149092145     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2804901     Document Type: Article

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