The Dresden EBIT: A novel source of x-rays front highly charged ions

X-Ray Spectrometry

Volumn 33, Issue 1, 2004, Pages 33-38

  Kentsch, U ^a   Landgraf, S ^a   Zschornack, G ^a   Grossmann, F ^b   Ovsyannikov, V P ^b   Ullmann, F ^b  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b Leybold Vakuum Dresden GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

IMPACT IONIZATION;

DIELECTRONIC RECOMBINATION PROCESS; DIRECT EXCITATION; DRESDENS; ELECTRON IMPACT-IONIZATION; ELECTRON-IMPACT IONIZATION; HIGH-DENSITY ELECTRON BEAMS; HIGHLY CHARGED IONS; NEUTRAL ATOMS; RADIATIVE RECOMBINATION; X-RADIATION;

IONS;

EID: 0742267884     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.702     Document Type: Conference Paper

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