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Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 178, Issue 1-4, 2001, Pages 260-264

The Dresden EBIT: An ion source for materials research and technological applications of low-energy highly charged ions

(5) Werner, T a Zschornack, G a Grossmann, F b Ovsyannikov, V P b Ullmann, F b

a DRESDEN UNIVERSITY OF TECHNOLOGY (Germany)

b LEYBOLD Systems + Service GmbH (Germany)

Author keywords

Electron beam ion trap; Highly charged ions; Ion extraction; Technological applications; X ray spectroscopy

Indexed keywords

CARRIER MOBILITY; ELECTRON BEAMS; ION BEAMS; ION SOURCES; IONIZATION OF SOLIDS; X RAY SPECTROSCOPY;

ELECTRON BEAM ION TRAP (EBIT); HIGHLY CHARGED IONS;

ELECTRON TRAPS;

EID: 0035335173 PISSN: 0168583X EISSN: None Source Type: Journal
DOI: 10.1016/S0168-583X(01)00515-8 Document Type: Conference Paper

Times cited : (7)

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