Atom chips in the real world: The effects of wire corrugation

European Physical Journal D

Volumn 32, Issue 2, 2005, Pages 171-180

  Schumm, T ^a   Esteve J ^a   Figl, C ^a,b   Trebbia, J B ^a   Aussibal, C ^a   Nguyen, H ^a   Mailly, D ^a   Bouchoule, I ^a   Westbrook, C I ^a   Aspect, A ^a  

^a CNRS   (France)

^b LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; ELECTRON BEAM LITHOGRAPHY; GOLD;

'CURRENT; ATOM CHIPS; COLD ATOMS; CURRENTS DISTRIBUTIONS; DETAILED MODELS; MAGNETIC-FIELD; MICROWIRE; REAL-WORLD; SHAPED WIRE; TRAPPING POTENTIAL;

WIRE;

EID: 21244490139     PISSN: 14346060     EISSN: 14346079     Source Type: Journal    
DOI: 10.1140/epjd/e2005-00016-x     Document Type: Conference Paper

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