Pattern pruner: Automatic pattern size reduction method that uses computational intelligence-based testing

Proceedings - International Test Conference

Volumn , Issue , 2007, Pages

  Hong, Eric Liau Chee ^a   Menke, Manfred ^a   Janik, Thomas ^a   Schmitt Landsiedel, Doris ^b  

^a INFINEON TECHNOLOGIES AG   (Germany)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ARTIFICIAL INTELLIGENCE; AUTOMATIC PROGRAMMING; PATTERN RECOGNITION; SOFTWARE DESIGN; STATIC RANDOM ACCESS STORAGE;

ASYNCHRONOUS OPERATIONS; AUTOMATIC TEST EQUIPMENT (ATE); PATTERN PRUNERS; PATTERN SIZE REDUCTION;

SOFTWARE TESTING;

EID: 39749090498     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2006.297653     Document Type: Conference Paper

References (17)

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