Ultrathin polypyrrole films on silicon substrates

Electrochimica Acta

Volumn 53, Issue 11, 2008, Pages 4046-4050

  Intelmann, Carl Matthias ^a   Syritski, Vitali ^b   Tsankov, Dimiter ^c   Hinrichs, Karsten ^d   Rappich, Jörg ^a  

^a HAHN MEITNER INSTITUT   (Germany)

^b TALLINN UNIVERSITY OF TECHNOLOGY   (Estonia)

^c INSTITUTE OF ORGANIC CHEMISTRY   (Bulgaria)

^d ISAS INSTITUTE FOR ANALYTICAL SCIENCES   (Germany)

Author keywords

Electrodeposition; Infrared spectroscopic ellipsometry; Passivation; Photoluminescence; Polypyrrole; Silicon

Indexed keywords

CYCLIC VOLTAMMETRY; DEFECTS; ELECTRODEPOSITION; ELECTROLYTES; PASSIVATION; PHOTOLUMINESCENCE; POLYPYRROLES; SILICON; SPECTROSCOPIC ELLIPSOMETRY; ULTRATHIN FILMS;

INFRARED SPECTROSCOPIC ELLIPSOMETRY; NON-RADIATIVE RECOMBINATION-ACTIVE (NR) DEFECTS; SILICON SURFACE;

POLYMER FILMS;

EID: 39749084005     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2007.11.036     Document Type: Article

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