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Thin Solid Films

Volumn 516, Issue 10, 2008, Pages 3112-3116

Electrical properties of NiO films obtained by high-temperature oxidation of nickel

(1) Makhlouf, Salah A a

a Assiut University (Egypt)

Author keywords

Electrical properties; Nickel oxide; Oxidation; Thin films

Indexed keywords

ELECTRIC PROPERTIES; NICKEL OXIDE; OXIDATION;

HIGH-TEMPERATURE OXIDATION; NICKEL OXIDE THIN FILMS;

THIN FILMS;

EID: 39649100670 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2007.07.213 Document Type: Article

Times cited : (36)

References (31)

1
- 0030105850
- Fujii E., Tomozawa A., Torii H., and Takayama R. Jpn. J. Appl. Phys. 35 (1996) L328
- (1996) Jpn. J. Appl. Phys. , vol.35
- Fujii, E.¹ Tomozawa, A.² Torii, H.³ Takayama, R.⁴

2
- 36549096424
- Estrada W., Andersson A., and Granqvist C. J. Appl. Phys. 64 (1998) 3678
- (1998) J. Appl. Phys. , vol.64 , pp. 3678
- Estrada, W.¹ Andersson, A.² Granqvist, C.³

3
- 0032309049
- Azens A., Kullman L., Vaivars G., Nordborg H., and Granqvist C. Solid State Ionics 113 (1998) 449
- (1998) Solid State Ionics , vol.113 , pp. 449
- Azens, A.¹ Kullman, L.² Vaivars, G.³ Nordborg, H.⁴ Granqvist, C.⁵

4
- 0032058309
- Hotovy I., Buc D., Hascik S., and Nennewitz O. Vacuum 50 (1998) 41
- (1998) Vacuum , vol.50 , pp. 41
- Hotovy, I.¹ Buc, D.² Hascik, S.³ Nennewitz, O.⁴

5
- 0037168489
- Hotovy I., Huran J., Spiess L., Liday J., Sitter H., and Hascik S. Vacuum 69 (2003) 237
- (2003) Vacuum , vol.69 , pp. 237
- Hotovy, I.¹ Huran, J.² Spiess, L.³ Liday, J.⁴ Sitter, H.⁵ Hascik, S.⁶

6
- 33645528448
- Lee J.W., Park I.H., and Chung C.W. Integr. Ferroelectr. 74 (2005) 71
- (2005) Integr. Ferroelectr. , vol.74 , pp. 71
- Lee, J.W.¹ Park, I.H.² Chung, C.W.³

7
- 33751557951
- You Y.-H., So B.-S., Hwang J.-H., Cho W., Lee S.S., Chung T.-M., Kim C.G., and An K.-S. Appl. Phys. Lett. 89 (2006) 222105
- (2006) Appl. Phys. Lett. , vol.89 , pp. 222105
- You, Y.-H.¹ So, B.-S.² Hwang, J.-H.³ Cho, W.⁴ Lee, S.S.⁵ Chung, T.-M.⁶ Kim, C.G.⁷ An, K.-S.⁸

8
- 36149023858
- Morin F.J. Phys. Rev. 93 (1954) 1199
- (1954) Phys. Rev. , vol.93 , pp. 1199
- Morin, F.J.¹

9
- 0342681275
- Adler D., and Feinleib J. Phys. Rev., B 2 (1970) 3112
- (1970) Phys. Rev., B , vol.2 , pp. 3112
- Adler, D.¹ Feinleib, J.²

10
- 0014699693
- Bosman A.J., and Vandaal H.J. Adv. Phys. 19 (1970) 1
- (1970) Adv. Phys. , vol.19 , pp. 1
- Bosman, A.J.¹ Vandaal, H.J.²

11
- 0031169549
- Pushparajah P., and Radhakrishna S. J. Mater. Sci. 32 (1997) 3001
- (1997) J. Mater. Sci. , vol.32 , pp. 3001
- Pushparajah, P.¹ Radhakrishna, S.²

12
- 36049056239
- bosman A.J., and Crevecoeur. Phys. Rev. 144 (1965) 763
- (1965) Phys. Rev. , vol.144 , pp. 763
- bosman, A.J.¹ Crevecoeur²

13
- 0002221322
- Van Houten S. J. Phys. Chem. Solids 17 (1960) 7
- (1960) J. Phys. Chem. Solids , vol.17 , pp. 7
- Van Houten, S.¹

14
- 36849126927
- Heikes R.R., and Johnston W.D. J. Chem. Phys. 26 (1957) 582
- (1957) J. Chem. Phys. , vol.26 , pp. 582
- Heikes, R.R.¹ Johnston, W.D.²

15
- 0000722555
- Lunkenheimer P., Loidl A., Ottermann C.R., and Bange K. Phys. Rev., B 44 (1991) 5927
- (1991) Phys. Rev., B , vol.44 , pp. 5927
- Lunkenheimer, P.¹ Loidl, A.² Ottermann, C.R.³ Bange, K.⁴

16
- 0035043829
- Biju V., and Abdul Khadar M. Mater. Res. Bull. 36 (2001) 21
- (2001) Mater. Res. Bull. , vol.36 , pp. 21
- Biju, V.¹ Abdul Khadar, M.²

17
- 0242569484
- Biju V., and Abdul Khadar M. J. Mater. Sci. 38 (2003) 4055
- (2003) J. Mater. Sci. , vol.38 , pp. 4055
- Biju, V.¹ Abdul Khadar, M.²

18
- 0000361908
- Kitao M., Izawa K., Urabe K., Komatsu T., Kuwano S., and Yamada S. Jpn. J. Appl. Phys. 33 (1994) 6656
- (1994) Jpn. J. Appl. Phys. , vol.33 , pp. 6656
- Kitao, M.¹ Izawa, K.² Urabe, K.³ Komatsu, T.⁴ Kuwano, S.⁵ Yamada, S.⁶

19
- 0030190828
- Ushio Y., Ishikawa A., and Niwa T. Thin Solid Films 280 (1996) 233
- (1996) Thin Solid Films , vol.280 , pp. 233
- Ushio, Y.¹ Ishikawa, A.² Niwa, T.³

20
- 0031168883
- Miller E., and Rocheleau R.J. Electrochem. Soc. 144 (1997) 1995
- (1997) Electrochem. Soc. , vol.144 , pp. 1995
- Miller, E.¹ Rocheleau, R.J.²

21
- 0027866818
- Sato H., Minami T., Takana S., and Yamada T. Thin Solid Films 236 (1993) 27
- (1993) Thin Solid Films , vol.236 , pp. 27
- Sato, H.¹ Minami, T.² Takana, S.³ Yamada, T.⁴

22
- 0037203951
- Song S., and Xiao P. Mater. Sci. Eng., A 323 (2002) 27
- (2002) Mater. Sci. Eng., A , vol.323 , pp. 27
- Song, S.¹ Xiao, P.²

23
- 0003495856
- Joint Committee on Powder Diffraction Standard, Philadelphia, PA Card No. 47-1049
- Powder Diffraction File (1999), Joint Committee on Powder Diffraction Standard, Philadelphia, PA Card No. 47-1049
- (1999) Powder Diffraction File

24
- 0003570874
- Butterworth, London
- Smithels C., and Smithels J. "Metals Reference Book". 7th ed. (1992), Butterworth, London
- (1992) "Metals Reference Book". 7th ed.
- Smithels, C.¹ Smithels, J.²

25
- 0034861254
- Schmid B., Aas N., Grong Ø., and Ødegård R. Scanning 23 (2001) 255
- (2001) Scanning , vol.23 , pp. 255
- Schmid, B.¹ Aas, N.² Grong, Ø.³ Ødegård, R.⁴

26
- 39649113029
- López-Beltrán A.M., and Mendoza-Galván A. Thin Solid Films 40 (2006) 503
- (2006) Thin Solid Films , vol.40 , pp. 503
- López-Beltrán, A.M.¹ Mendoza-Galván, A.²

27
- 0020243970
- Wittenauer M.A., and Van Zandt L.L. Philos. Mag., B 46 (1982) 659
- (1982) Philos. Mag., B , vol.46 , pp. 659
- Wittenauer, M.A.¹ Van Zandt, L.L.²

28
- 0001752674
- Snowden D.P., and Saltzburg H. Phys. Rev. Lett. 14 (1965) 497
- (1965) Phys. Rev. Lett. , vol.14 , pp. 497
- Snowden, D.P.¹ Saltzburg, H.²

29
- 33749551787
- Rao K.V., and Smakula A. J. Appl. Phys. 36 (1965) 2031
- (1965) J. Appl. Phys. , vol.36 , pp. 2031
- Rao, K.V.¹ Smakula, A.²

30
- 0014441665
- Austin I., and Mott N.F. Adv. Phys. 18 (1969) 41
- (1969) Adv. Phys. , vol.18 , pp. 41
- Austin, I.¹ Mott, N.F.²

31
- 0011492655
- Jonscher A.K., and Reau J.M. J. Mater. Sci. 13 (1978) 563
- (1978) J. Mater. Sci. , vol.13 , pp. 563
- Jonscher, A.K.¹ Reau, J.M.²

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