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Volumn 51, Issue 8, 2004, Pages 1323-1330

Gate-drain charge analysis for switching in power trench MOSFETs

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC BREAKDOWN; ELECTRIC RESISTANCE; OPTIMIZATION; POWER CONVERTERS; POWER SUPPLY CIRCUITS; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE STRUCTURES; THRESHOLD VOLTAGE; VOLTAGE REGULATORS;

EID: 3943065749     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2004.832096     Document Type: Article
Times cited : (62)

References (12)
  • 1
    • 0005327701 scopus 로고    scopus 로고
    • A study of MOSFET performance in processor targeted buck and synchronous rectifier buck converters
    • L. Spaziani, "A study of MOSFET performance in processor targeted buck and synchronous rectifier buck converters," Proc. High Frequency Power Conversion, pp. 123-137, 1996.
    • (1996) Proc. High Frequency Power Conversion , pp. 123-137
    • Spaziani, L.1
  • 6
    • 0036047476 scopus 로고    scopus 로고
    • Low on-resistance and low feedback charge lateral power MOSFETs with multi-drain regions for high-efficient dc/dc converters
    • K. Sakamoto, M. Shraishi, and T. Iwasaki, "Low on-resistance and low feedback charge lateral power MOSFETs with multi-drain regions for high-efficient dc/dc converters," in Proc. ISPSD, 2002, pp. 25-28.
    • (2002) Proc. ISPSD , pp. 25-28
    • Sakamoto, K.1    Shraishi, M.2    Iwasaki, T.3
  • 8
    • 0031618263 scopus 로고    scopus 로고
    • Analysis of power losses in MOSFET synchronous rectifiers by using their design parameters
    • S. Shinohara, "Analysis of power losses in MOSFET synchronous rectifiers by using their design parameters," in Proc. ISPSD, 1998, pp. 347-350.
    • (1998) Proc. ISPSD , pp. 347-350
    • Shinohara, S.1
  • 11
    • 0026819795 scopus 로고
    • A new recombination model for device simulation including tunneling
    • Feb
    • G. A. M. Hurkx, D. B. M. Klaassen, and M. P. G. Knuvers, "A new recombination model for device simulation including tunneling," IEEE Trans. Electron Devices, vol. 39, pp. 331-338, Feb. 1992.
    • (1992) IEEE Trans. Electron Devices , vol.39 , pp. 331-338
    • Hurkx, G.A.M.1    Klaassen, D.B.M.2    Knuvers, M.P.G.3
  • 12
    • 3943049083 scopus 로고
    • Trench gate structure with thick bottom oxide
    • Feb. 12
    • H.-R. Chang, "Trench gate structure with thick bottom oxide," U.S. Patent 4 992 390, Feb. 12, 1991.
    • (1991) U.S. Patent 4 992 390
    • Chang, H.-R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.