Influence of waveguide geometry on scattering loss effects in submicron strip silicon-on-insulator waveguides

IET Optoelectronics

Volumn 2, Issue 1, 2008, Pages 1-5

  Grillot, F ^a   Vivien, L ^b   Cassan, E ^b   Laval, S ^b  

^a INSA DE RENNES   (France)

^b UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC FIELD EFFECTS; GEOMETRY; SCATTERING; SEMICONDUCTOR INSULATOR BOUNDARIES;

SILICON-ON-INSULATOR (SOI); STRIP WAVEGUIDES;

OPTICAL WAVEGUIDES;

EID: 39349107553     PISSN: 17518768     EISSN: None     Source Type: Journal    
DOI: 10.1049/iet-opt:20070001     Document Type: Article

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