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Volumn 15, Issue 6, 1997, Pages 1020-1025

Roughness, inhomogeneity, and integrated optics

Author keywords

Coupled mode analysis; Dielectric waveguides; Optical losses

Indexed keywords

COUPLED MODE ANALYSIS; OPTICAL LOSSES;

EID: 0031166546     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/50.588676     Document Type: Article
Times cited : (75)

References (18)
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    • note
    • Stationary processes are those whose average quantities (e.g., mean, standard deviation, etc.) do not evolve in time (or distance).
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.