Reducing photodiode reflectance by Brewster-angle operation

Metrologia

Volumn 45, Issue 1, 2008, Pages 11-15

  Sildoja, Meelis ^a   Manoocheri, Farshid ^a   Ikonen, Erkki ^a  

^a AALTO UNIVERSITY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC VARIABLES MEASUREMENT; ELECTROMAGNETIC WAVE REFLECTION; OXIDE FILMS; PHOTODETECTORS; SILICONES; UNCERTAINTY ANALYSIS; WAVELENGTH;

BREWSTER ANGLE OPERATION; MEASUREMENT UNCERTAINTIES; MULTIPLE WAVELENGTHS; REFLECTANCE LOSSES; SILICON PHOTODIODE DETECTOR;

PHOTODIODES;

EID: 38949193840     PISSN: 00261394     EISSN: 16817575     Source Type: Journal    
DOI: 10.1088/0026-1394/45/1/002     Document Type: Article

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