Prospects for improving the accuracy of silicon photodiode self-calibration with custom cryogenic photodiodes

Metrologia

Volumn 40, Issue 1 SPEC., 2003, Pages

  Geist, Jon ^a   Brida, Giorgio ^b   Rastello, Maria Luisa ^b  

^a Sequoyah Technology LLC   (United States)

^b ISTITUTO ELETTROTECNICO NAZIONALE GALILEO FERRARIS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; COMPUTER SIMULATION; CRYOGENICS; IMPACT IONIZATION; PHOTOCURRENTS; PHOTONS; QUANTUM EFFICIENCY; SEMICONDUCTING SILICON; SUBSTRATES;

CUSTOM CRYOGENIC PHOTODIODES; SILICON PHOTODIODE SELF-CALIBRATION;

PHOTODIODES;

EID: 0037226005     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/40/1/003     Document Type: Article

References (5)

1. Zalewski E F and Geist J 1980 Silicon photodiode absolute spectral response self-calibration Appl. Opt. 19 1214
2. Clugston D A and Basore P A 1996 PC1D version 5: 32 bit solar cell modelling on personal computers Proc. 26th IEEE Photovoltaic Specialists Conf. (Washington, DC) (available at http://www.pv.unsw.edu.au/pc1d)
3. Zalewski E F and Duda C R 1983 Silicon photodiode device with 100% external quantum efficiency Appl. Opt. 22 2867-73
4. Koehler R, Luther J L and Geist J 1990 Reflectometer for measurements of scattering from photodiodes and other low scattering surfaces Appl. Opt. 29 3130-4
5. Sze S M 1981 Physics of Semiconductor Devices 2nd edn (New York: Wiley) pp 47, 49