Absolute calibration of silicon photodiodes by purely relative measurements

Metrologia

Volumn 41, Issue 3, 2004, Pages 204-212

  Gran, Jarle ^a,b   Sudbø, Aasmund S ^b  

^a Justervesenet   (Norway)

^b UNIVERSITY OF OSLO   (Norway)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; COMPUTER SIMULATION; MEASUREMENT THEORY; QUANTUM THEORY; RADIOMETERS; SIGNAL TO NOISE RATIO; SILICON; THIN LAYER CHROMATOGRAPHY; VACUUM;

OXIDE THICKNESS; QUANTUM DETECTORS; SILICON TRAP; WAVELENGTH;

PHOTODIODES;

EID: 3042680265     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/41/3/014     Document Type: Article

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