SCOPUS 정보 검색 플랫폼

Volumn 100, Issue 5, 2008, Pages

Measurement of the elastic constants of a columnar SiC thin film

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; SILICON CARBIDE; THIN FILMS; ULTRASONICS;

COLUMNAR CRYSTALLINE GRAINS; ELASTICALLY ISOTROPIC; RESONANT ULTRASOUND SPECTROSCOPY;

ELASTIC CONSTANTS;

EID: 38949156865 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.100.055503 Document Type: Article

Times cited : (27)

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