Measurements of elastic constants in thin films of colossal magnetoresistance material

Physical Review Letters

Volumn 90, Issue 3, 2003, Pages

  So, Jin H ^a   Gladden, J R ^a   Hu, Y H ^a   Maynard, J D ^a   Li, Qi ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COLOSSAL MAGNETORESISTANCE; CRYSTAL STRUCTURE; ELECTRIC RESISTANCE MEASUREMENT; EPITAXIAL GROWTH; FILM GROWTH; LANTHANUM COMPOUNDS; PEROVSKITE; PHASE TRANSITIONS; PULSED LASER DEPOSITION; SPECTROSCOPY; STRONTIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

ELASTIC CONSTANT; FILM THICKNESS; LANTHANUM CALCIUM MANGANITE; STRONTIUM TITANATE; ULTRASOUND SPECTROSCOPY;

MAGNETIC THIN FILMS;

EID: 0037462922     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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