Electric force microscopy investigation of a MEH-PPV conjugated polymer blend: Robustness or frailty?

Ultramicroscopy

Volumn 108, Issue 4, 2008, Pages 302-308

  Patricio P S O ^a   Cury, L A ^a   Silva, G G ^a   Neves, B R A ^a  

^a FEDERAL UNIVERSITY OF MINAS GERAIS   (Brazil)

Author keywords

Blends; Conductive polymer; Electric force microscopy; MEH PPV

Indexed keywords

ELECTRIC FORCE MICROSCOPY (EFM); THERMOPLASTIC POLYURETHANE (TPU);

ELECTRIC PROPERTIES; MATHEMATICAL MODELS; POLYURETHANES; ROBUSTNESS (CONTROL SYSTEMS); THERMOPLASTICS;

POLYMER BLENDS;

POLY[2 METHOXY 5 (2' ETHYLHEXYLOXY) 1.4 PHENYLENEVINYLENE]; POLYMER; POLYURETHAN; UNCLASSIFIED DRUG;

ARTICLE; CONDUCTOR; DIELECTRIC CONSTANT; ELECTRIC FORCE MICROSCOPY; ELECTRON MICROSCOPY; MATERIALS TESTING; QUANTITATIVE ANALYSIS; THEORETICAL MODEL;

EID: 38949151858     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.04.002     Document Type: Article

References (29)

1. Bonnell D.A. Scanning Probe Microscopy, Spectroscopy (2001), Wiley-VCH, New York (Chapter 7 and references therein.)
2. Bridger P.M., Bandic Z.Z., Piquette E.C., and McGill T.C. Appl. Phys. Lett. 74 (1999) 3522
3. Bockrath M., Markovic N., Shepard A., Tinkham M., Gurevich L., Kouwenhoven L.P., Wu M.W., and Sohn L.L. Nano. Lett. 2 (2002) 187
4. Staii C., Johnson Jr. A.T., and Pinto N.C. Nano Lett 4 (2004) 859
5. Reese C., Roberts M., Ling M., and Bao Z. Mater. Today 7 9 (2004) 20
6. Schindler F., Lupton J., Muller J., Feldmann J., and Scherf U. Nat. Mater. 5 (2006) 141
7. Moliton A., and Hiorns R.C. Polym. Int. 53 (2004) 1397
8. McGehee M.D., Gupta R., Veenstra S., Miller E.K., Díaz-García M.A., and Heeger A.J. Phys. Rev. B 58 (1998) 7035
9. Hertel D., Setayesh S., Nothofer H.G., Scherf U., Müllen K., and Bässler H. Adv. Mater. 13 (2001) 65
10. Muller J.G., Anni M., Scherf U., Lupton J.M., and Feldman J. Phys. Rev. B 70 (2004) 035205
11. Sirringhaus H., Brown P.J., Friend R.H., Nielsen M.M., Bechgaard K., Langeveld-Voss B.M.W., Spiering A.J.H., Janssen R.A.J., Meijer E.W., Herwig P., and De Leeuw D.M. Nature 401 (1999) 685
12. Chiguvare Z., and Dyakonov V. Phys. Rev. B 70 (2004) 235207
13. Gupta R., Stevenson M., Dogariu A., McGehee M.D., Park J.Y., Srdanov V., and Heeger A.J. Appl. Phys. Lett. 73 (1998) 3492
14. Chou H.L., Hsu S.Y., and Wei P.K. Polymer 46 (2005) 4967
15. Carter S.A., Scott J.C., and Brock P.J. Appl. Phys. Lett. 71 (1997) 1145
16. Lin H., Weng Y., Huang H., He Q., Zheng M., and Bai F. Appl. Phys. Lett. 84 (2004) 2980
17. Chouiki M., Boiteux G., Davenas J., Massantier V., Glowacki I., Luszczynska B., Wypych A., Ulanski J., Niziol J., and Armatys P. Mol. Cryst. Liq. Cryst. 416 (2004) 1
18. Patrício P.S.O., de Oliveira F.A.C., Righi A., Neves B.R.A., Silva G.G., and Cury L.A. J. Appl. Phys. 101 (2007) 033133
19. TappingMode and LiftMode are registered trademarks of Veeco Instruments, Santa Bárbara, USA.
20. Ltaief A., Bouazizi A., Davenas J., Ben Chaabane R., and Ben Ouada H. Synth. Met. 147 (2004) 261
21. Santos L.F., Bianchi R.F., and Faria R.M. J. Non-Cryst. Sol. 338 (2004) 590
22. Jeon T.I., Kim K.J., Mukherjee A.K., and Menon R. Synth. Met. 150 (2005) 53
23. Ku T.H., Hsu J.H., Lin H.N., Meng H.F., Chen M.C., and Chen S.A. Nanotechnology 17 (2006) 2279
24. Sader J.E., Chon J.W.M., and Mulvaney P. The cantilever spring constant was determined using the Sader method. Rev. Sci. Instrum. 70 (1999) 3967
25. Nam J.D., Hwang S.D., Choi H.R., Lee J.H., Kim K.J., and Heo S. Smart Mater. Struc. 14 (2005) 87
26. Campoy-Quiles M., Etchegoin P.G., and Bradley D.D.C. Phys. Rev. B 72 (2005) 045209
27. Tammer M., and Monkman A.P. Adv. Mater. 14 (2002) 210
28. Silva-Pinto E., and Neves B.R.A. Nanotechnology 16 (2005) 2923
29. Diaconu I., and Dorohoi D. J. Optoelectron. Adv. Mater. 7 (2005) 921