Multi-wavelength heterodyne-detected scattering-type scanning near-field optical microscopy

Ultramicroscopy

Volumn 108, Issue 4, 2008, Pages 314-319

  Chu, Jen You ^a   Wang, Tien Jen ^a   Chang, You Chia ^a   Lin, Ming Wei ^a   Yeh, Jyi Tyan ^a   Wang, Juen Kai ^b  

^a INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

Heterodyne detection; Scattering type scanning near field optical microscopy; Surface plasmons

Indexed keywords

DISPERSION (WAVES); IMAGE ACQUISITION; NEAR FIELD SCANNING OPTICAL MICROSCOPY; PHOTONICS; PLASMONS; SURFACE PLASMON RESONANCE; WAVELENGTH;

HETERODYNE DETECTION; METALLIC STRUCTURES; NEAR-FIELD OPTICAL IMAGES;

HETERODYNING;

NANOMATERIAL;

ARTICLE; IMAGE ANALYSIS; LIGHT SCATTERING; NANOENGINEERING; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SURFACE PLASMON RESONANCE;

EID: 38949123979     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.04.018     Document Type: Article

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