Magnetic field enhanced nano-tip fabrication for four-probe STM studies

Nanotechnology

Volumn 19, Issue 8, 2008, Pages

  McKendry, J E ^a   Allen, C S ^a   Critchley, K ^b   Gorzny M L ^a   Walton, A S ^a   Evans, S D ^a  

^a UNIVERSITY OF LEEDS   (United Kingdom)

^b UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; MAGNETIC FIELDS; MEASUREMENT THEORY; NANOTIPS;

FOUR-PROBE STM STUDIES; MEASURING NANOSCALE OBJECTS;

TUNGSTEN;

ELECTROLYTE; NANOMATERIAL; TUNGSTEN;

ARTICLE; MAGNETIC FIELD; MEASUREMENT; MECHANICAL PROBE; NANO TIP; NANODEVICE; NANOFABRICATION; PRIORITY JOURNAL;

EID: 38949098134     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/8/085201     Document Type: Article

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