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Volumn 71, Issue 3, 2005, Pages

Mechanics of lithographically defined break junctions

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; ELECTRODE; GEOMETRY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR; SUPERCONDUCTOR;

EID: 15444365147     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.71.035313     Document Type: Article
Times cited : (65)

References (20)
  • 12
    • 15444380416 scopus 로고    scopus 로고
    • note
    • 2 axis has been moved over a distance t/2 to the top of the strip.
  • 13
    • 15444370578 scopus 로고    scopus 로고
    • note
    • We note that, due to electrode deformation, one need not obtain contact at the exact same place the junction broke.
  • 15
    • 15444380514 scopus 로고    scopus 로고
    • note
    • Au of order 0.1 eV.
  • 17
    • 84856128182 scopus 로고    scopus 로고
    • Ph.D. thesis, Université Paris
    • C. Lebreton, Ph.D. thesis, Université Paris 6, 1996.
    • (1996) , pp. 6
    • Lebreton, C.1
  • 20
    • 15444368731 scopus 로고    scopus 로고
    • note
    • -1. In this experiment, however, we could not open the junction to resistances exceeding 100 MΩ, indicating that substantial plastic deformation had spoiled the calibration. Most likely, the polyimide was unable to accommodate the deformation and broke.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.